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Jahanzeb Anwer and Marco Platzner (2014) "Analytic Reliability Evaluation for Fault-Tolerant Circuit Structures on FPGAs", 17th IEEE International Symposium on Defect and Fault-tolerance in VLSI and Nanotechnology Systems
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Jahanzeb Anwer, Marco Platzner and Sebastian Meisner (2014) "FPGA Redundancy Configurations: An Automated Design Space Exploration", 21st IEEE Reconfigurable Architectures Workshop
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Jahanzeb Anwer, Sebastian Meisner and Marco Platzner (2013) "Dynamic Reliability Management: Reconfiguring Reliability-Levels of Hardware Designs at Runtime", 2013 International Conference on Reconfigurable Computing and FPGAs
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Usman Khalid, Jahanzeb Anwer, Narinderjit Singh, Nor H. Hamid, Vijanth S. Asirvadam (2012) "Determination of Worst Case Input Combinations of Nanoscale Circuits Using Bayesian Networks", International Conference on Intelligent and Advanced Systems, pp: 761-764
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N. S. S. Singh, N. H. Hamid, V. S. Asirvadam, U. Khalid and J. Anwer (2012) "Evaluation of Circuit Reliability based on Distribution of Different Signal Input Patterns", IEEE-CSPA, pp: 5-9
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N. S. S. Singh, N. H. Hamid, V. S. Asirvadam, U. Khalid and J. Anwer (2012) "Reliability Automation Tool (RAT) For Fault Tolerance Computation", IEEE-ICFAS
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Jahanzeb Anwer, Usman Khalid, N. S. S. Singh, N. H. Hamid and V. S. Asirvadam (2012) "Reliable Area Index: A Novel Approach to Measure Reliability of Markov Random Field based Circuits", International Conference on Intelligent and Advanced Systems, pp: 851-853
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N. S. S. Singh, N. H. Hamid, V. S. Asirvadam, U. Khalid and J. Anwer (2012) "Sensitivity Analysis of Probability Transfer Matrix (PTM) on same Functionality Circuit Architectures", IEEE-CSPA, pp: 250-254
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Jahanzeb Anwer, Usman Khalid, Narinderjit Singh, Nor H. Hamid, Vijanth S. Asirvadam (2011) "Analyzing Thermal and Flicker Noise Fault-Tolerance Capability of Markov Random Field Digital Circuits", International Conference on Computer Technology and Development, pp: 197-201
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Usman Khalid, Jahanzeb Anwer, Narinderjit Singh, Nor H. Hamid, Vijanth S. Asirvadam (2011) "Determination of Sensitive Inputs of Digital Circuits Using Bayesian Netwroks Reliability Analysis", IEEE Regional Symposium on Micro and Nano Electronics, pp: 186-189
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Muhammad Usman Rafique, Saad Aslam and Jahanzeb Anwer (2011) "Implementation of a Novel Microcontroller-Based Voltage Source Sine-Wave Inverter", 9th International Conference on Frontiers of Information Technology, pp: 167-172
(External URL)
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Usman Khalid, Jahanzeb Anwer, Narinderjit Singh, Nor H. Hamid, Vijanth S. Asirvadam (2011) "Improvement in Reliability by Changing the Deterministic Inputs of Nanoscale Circuits", IEEE Regional Symposium on Micro and Nano Electronics
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Usman Khalid, Jahanzeb Anwer, Narinderjit Singh, Nor H. Hamid, Vijanth S. Asirvadam (2011) "Reliability-Evaluation of Digital Circuits using
Probabilistic Computation ", IEEE-National Postgraduate Conference, pp: 1-4
(External URL)
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Usman Khalid, Jahanzeb Anwer, Narinderjit Singh, Nor H. Hamid, Vijanth S. Asirvadam (2010) "Computation and Analysis of Output-Error Probability for C17 Benchmark Circuit Using Bayesian Networks Error Modeling", IEEE Student Conference on Research and Development, pp: 348-351
(External URL)
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Jahanzeb Anwer, Ahmad Fayyaz, Muhammad M. Masud, Saleem F. Shaukat, Usman Khalid, Nor H. Hamid (2010) "Fault-Tolerance and Noise Modelling in Nanoscale Circuit Design", IEEE International Symposium on Signals Systems and Electronics, pp: 1-4
(External URL)
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Jahanzeb Anwer, Usman Khalid, Narinderjit Singh, Nor H. Hamid, Vijanth S. Asirvadam (2010) "Highly Noise-Tolerant Design of Digital Logic Gates using Markov Random Field Modelling", IEEE International Conference on Electronic Computer Technology, pp: 24-28
(External URL)
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Jahanzeb Anwer, Usman Khalid, Narinderjit Singh, Nor H. Hamid, Vijanth S. Asirvadam (2010) "Joint and Marginal Probability Analyses of Markov Random Field Networks for Digital Logic Circuits", IEEE International Conference on Intelligent and Advanced Systems, pp: 1-4
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